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A new approach to plane-sweep overlay: topological structuring and line-segment classification

Jan W. van Roessel
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Abstract

An integrated approach to spatial overlay was developed with the objective of creating a single function that can perform most of the tasks now assigned to discrete functions in current systems. Two important components of this system are a unique method for topological structuring, and a method for attribute propagation and line-segment classification. -Author

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Jan W. van Roessel. 2013-03-14. A new approach to plane-sweep overlay: topological structuring and line-segment classification. https://doi.org/10.1559/152304091783805572

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