TY  - RPRT
TI  - Characterizing fault roughness—Are faults rougher at long or short wavelengths?
AU  - Nicholas M. Beeler
PY  - 2021
DO  - 10.3133/ofr20201134
UR  - https://pubs.usgs.gov/publication/ofr20201134
ID  - ofr20201134
ER  -