TY  - RPRT
TI  - Embedded critical material flow: The case of niobium, the United States, and China
AU  - Dalton M. McCaffrey
AU  - Nedal T. Nassar
AU  - Simon M. Jowitt
AU  - Abraham J. Padilla
AU  - Laurence R. Bird
PY  - 2023
DO  - 10.1016/j.resconrec.2022.106698
UR  - https://pubs.usgs.gov/publication/70238015
ID  - 70238015
ER  -