@misc{indiciaeb16f64f22d26,
  title = {Embedded critical material flow: The case of niobium, the United States, and China},
  author = {Dalton M. McCaffrey and Nedal T. Nassar and Simon M. Jowitt and Abraham J. Padilla and Laurence R. Bird},
  year = {2023},
  doi = {10.1016/j.resconrec.2022.106698},
  url = {https://pubs.usgs.gov/publication/70238015},
  note = {Source identifier: 70238015}
}